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* MODIFICATION HISTORY:
*
* Ver    Who    Date    Changes
* ----- ---- -------- -----------------------------------------------
* 1.00a hbm  08/25/09 First release
* 
* *****************************************************************************/ /***************************** Include Files ********************************/ #include "xil_testio.h" #include "xil_assert.h" #include "xil_io.h" /************************** Constant Definitions ****************************/ /************************** Function Prototypes *****************************/ /** * * Endian swap a 16-bit word. * @param Data is the 16-bit word to be swapped. * @return The endian swapped valud. * */ static u16 Swap16(u16 Data) { return ((Data >> 8) & 0x00FF) | ((Data << 8) & 0xFF00); } /** * * Endian swap a 32-bit word. * @param Data is the 32-bit word to be swapped. * @return The endian swapped valud. * */ static u32 Swap32(u32 Data) { u16 Lo16; u16 Hi16; u16 Swap16Lo; u16 Swap16Hi; Hi16 = (u16)((Data >> 16) & 0x0000FFFF); Lo16 = (u16)(Data & 0x0000FFFF); Swap16Lo = Swap16(Lo16); Swap16Hi = Swap16(Hi16); return (((u32)(Swap16Lo)) << 16) | ((u32)Swap16Hi); } /*****************************************************************************/ /** * * Perform a destructive 8-bit wide register IO test where the register is * accessed using Xil_Out8 and Xil_In8, and comparing the reading and writing * values. * * @param Addr is a pointer to the region of memory to be tested. * @param Len is the length of the block. * @param Value is the constant used for writting the memory. * * @return * * - -1 is returned for a failure * - 0 is returned for a pass * *****************************************************************************/ int Xil_TestIO8(u8 *Addr, int Len, u8 Value) { u8 ValueIn; int Status; int Index; for (Index = 0; Index < Len; Index++) { Xil_Out8((u32)Addr, Value); ValueIn = Xil_In8((u32)Addr); Status = 0; if (Value != ValueIn) { return -1; } } return 0; } /*****************************************************************************/ /** * * Perform a destructive 16-bit wide register IO test. Each location is tested * by sequentially writing a 16-bit wide register, reading the register, and * comparing value. This function tests three kinds of register IO functions, * normal register IO, little-endian register IO, and big-endian regster IO. * When testing little/big-endian IO, the function performs the following * sequence, Xil_Out16LE/Xil_Out16BE, Xil_In16, Compare In-Out values, * Xil_Out16, Xil_In16LE/Xil_In16BE, Compare In-Out values. Whether to swap the * read-in value before comparing is controlled by the 5th argument. * * @param Addr is a pointer to the region of memory to be tested. * @param Len is the length of the block. * @param Value is the constant used for writting the memory. * @param Kind is the test kind. Acceptable values are: * XIL_TESTIO_DEFAULT, XIL_TESTIO_LE, XIL_TESTIO_BE. * @param Swap indicates whether to byte swap the read-in value. * * @return * * - -1 is returned for a failure * - 0 is returned for a pass * *****************************************************************************/ int Xil_TestIO16(u16 *Addr, int Len, u16 Value, int Kind, int Swap) { u16 ValueIn; int Status; int Index; for (Index = 0; Index < Len; Index++) { switch (Kind) { case XIL_TESTIO_LE: Xil_Out16LE((u32)Addr, Value); break; case XIL_TESTIO_BE: Xil_Out16BE((u32)Addr, Value); break; default: Xil_Out16((u32)Addr, Value); break; } ValueIn = Xil_In16((u32)Addr); Status = 0; if (Kind && Swap) ValueIn = Swap16(ValueIn); if (Value != ValueIn) { return -1; } /* second round */ Xil_Out16((u32)Addr, Value); switch (Kind) { case XIL_TESTIO_LE: ValueIn = Xil_In16LE((u32)Addr); break; case XIL_TESTIO_BE: ValueIn = Xil_In16BE((u32)Addr); break; default: ValueIn = Xil_In16((u32)Addr); break; } if (Kind && Swap) ValueIn = Swap16(ValueIn); if (Value != ValueIn) { return -1; } Addr++; } return 0; } /*****************************************************************************/ /** * * Perform a destructive 32-bit wide register IO test. Each location is tested * by sequentially writing a 32-bit wide regsiter, reading the register, and * comparing value. This function tests three kinds of register IO functions, * normal register IO, little-endian register IO, and big-endian register IO. * When testing little/big-endian IO, the function perform the following * sequence, Xil_Out32LE/Xil_Out32BE, Xil_In32, Compare, * Xil_Out32, Xil_In32LE/Xil_In32BE, Compare. Whether to swap the read-in value * before comparing is controlled by the 5th argument. * * @param Addr is a pointer to the region of memory to be tested. * @param Len is the length of the block. * @param Value is the constant used for writting the memory. * @param Kind is the test kind. Acceptable values are: * XIL_TESTIO_DEFAULT, XIL_TESTIO_LE, XIL_TESTIO_BE. * @param Swap indicates whether to byte swap the read-in value. * * @return * * - -1 is returned for a failure * - 0 is returned for a pass * *****************************************************************************/ int Xil_TestIO32(u32 *Addr, int Len, u32 Value, int Kind, int Swap) { u32 ValueIn; int Status; int Index; for (Index = 0; Index < Len; Index++) { switch (Kind) { case XIL_TESTIO_LE: Xil_Out32LE((u32)Addr, Value); break; case XIL_TESTIO_BE: Xil_Out32BE((u32)Addr, Value); break; default: Xil_Out32((u32)Addr, Value); break; } ValueIn = Xil_In32((u32)Addr); Status = 0; if (Kind && Swap) ValueIn = Swap32(ValueIn); if (Value != ValueIn) { return -1; } /* second round */ Xil_Out32((u32)Addr, Value); switch (Kind) { case XIL_TESTIO_LE: ValueIn = Xil_In32LE((u32)Addr); break; case XIL_TESTIO_BE: ValueIn = Xil_In32BE((u32)Addr); break; default: ValueIn = Xil_In32((u32)Addr); break; } if (Kind && Swap) ValueIn = Swap32(ValueIn); if (Value != ValueIn) { return -1; } Addr++; } return 0; }