CMOS Processing Technology
Silicon
: a semiconductor with resistance between that of conductor and an insulator.
Conductivity of silicon can be changed several orders of magnitude by introducing
impurity atoms
in silicon crystal lattice.
Impurities that
use
electrons: acceptors (p-type), e.g., Boron.
Impurities that
provide
electrons: donors (n-type), e.g., Phosphorous.
Wafer: 75mm to 230mm (~3" to ~9") and 0.25mm to 1mm thick.
Oxidation
: Formation of glass or SiO
2
.
Wet Oxidation
uses water vapor and
Dry Oxidation
uses pure oxygen.
SiO
2
growth consumes silicon, grows into the substrate.
SiO
2
is twice the volume of Si, projects above the substrate as well.
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Epitaxy, Ion-Implantation and Deposition/Diffusion: Ways of introducing impurities into pure silicon.
Epitaxy
: Single-crystal film grown on silicon surface.
Deposition
: Evaporate dopant material onto surface, high temps drive impurities into silicon bulk (diffusion).
Ion implantation
: Highly energized donor and acceptor atom driven into the silicon.
How much
dopant that is introduced is controlled by energy and amount of time.
Where
it is introduced is controlled by masks (thin films of special material).
Mask materials include:
photoresist
polysilicon
silicon dioxide (SiO
2
)
silicon nitride (SiN)
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Selective diffusion: Masks act as a barrier to prevent impurities from diffusing.
Process involves:
Patterning windows in the mask on the die surface.
Introducing impurities in exposed regions.
Removing the mask.
For example, to cut windows into the glass after oxidation step:
Acid resistant coating (photoresist) spread evenly on surface.
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Polymerized in areas exposed by UV light.
Mask controls region exposed.
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Organic solvent removes polymerized areas.
Windows are etched using an acid and the photoresist is removed.
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Positive resist: Exposed photoresist removed.
Negative resist: Unexposed photoresist removed.
UV light defraction and alignment tolerances limit line widths to ~0.8microns.
Electron beam lithography
: Reduces line width limits to 0.5microns.
Adv:
No intermediate hardware images such as masks.
Changes to patterns can be implemented immediately.
Disadv:
Cost of equipment is high.
Requires large amount of time to process each wafer.
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Polysilicon: A polycrystalline (not a single crystal) form of silicon.
Used as:
Interconnection material.
Gate electrodes.
*** A mask to allow precise definition of source and drain ***.
Undoped poly has a very high resistance.
Poly and the source/drain regions are usually doped at the same time.
Silicon Gate
Process:
Oxidation and etching of the active region:
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Thin Oxide grown:
Polysilicon deposited and etched:
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Etching of thinox and dopant Ion-Implantation or Deposition/Diffusion:
SiO
2
and contact cuts.
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Aluminum evaporated and etched:
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Parasitic MOS transistor:
Field device Countermeasures:
Make the threshold voltage of field device high by:
Making the field oxide thick.
Introducing a "channel-stop" diffusion (higher impurity concentration).
CMOS Processing Technology
Four main CMOS technologies:
n-well process
p-well process
twin-tub process
silicon on insulator
Major process steps of n-well process:
n-well mask
used to create n-well or n-tub via ion-implantation or deposition/diffusion.
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active mask
defines areas where transistors are fabricated.
p-well mask
used to produce channel-stop (p
+
diffusion), field oxide grown.
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poly mask
used to etch poly patterns.
n-plus mask
(
select mask
) used to indicate those thin-oxide areas and poly that are to implanted n
+
.
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p-plus mask
used to indicate those thin-oxide areas and poly that are to implanted p
+
.
Surface is covered with SiO
2
and contact cuts made.
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Metallization applied and etched using
metal mask
.
The wafer is then passivated and opening to bond pads are etched.